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Olympus NDT releases MXE-2.0 software for the OmniScan eddy current and eddy current array flaw detector

Olympus NDT, a world leader in nondestructive testing technologies, is pleased to announce the release of MXE software version 2.0 for the OmniScan® MXE flaw detector. The OmniScan MXE offers eddy current (EC) and eddy current array (ECA) technologies that are predominantly used to detect surface and slightly subsurface defects in the metallic structures found in aerospace, marine, automotive, and manufacturing applications.

The new MXE-2.0 software includes various new and advanced features to make eddy current and eddy current array inspections easier and faster than ever before. The software’s improved user interface boasts a comprehensive step-by-step Wizard Assistance Menu that ensures faster calibration and setup of application parameters. Alarm features are more intuitive with flexible setup conditions. Several other key features have been improved for the user including full compatibility with the Olympus Universal Multiplexer to enhance OmniScan MXE performance even further, a renewed raster scan function, and a seamless switch between eddy current inspection and eddy current array inspection. Combined with many other practical features, the changes that have been implemented in this new software package will provide inspection companies and quality control departments with the increased productivity, reduced training time, and expanded flexibility that only the OmniScan can offer.

Press release issued by Olympus Scientific Solutions America on July 4, 2008

 

 Contact details from our directory:
Olympus Scientific Solutions America Gauges, Inspection Equipment, Detectors, Transducers, Non-Destructive Test Equipment, Ultrasonic Inspection Equipment, Test Probes, Eddy Current Inspection Equipment

 

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Test Equipment
Non-Destructive Testing
Inspection Equipment

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