Non-contact stress analysis and mechanical testing

The ALTAIR Li system from Cedip Infrared Systems (www.cedip-infrared.com) employs a high performance infrared focal plane array camera to provide high quality thermal images of stress in materials and structures under dynamic loading conditions.

Using proprietary software these thermal images are converted into full field stress images in real time.  The ALTAIR Li system has the versatility to provide precise stress testing of structural components under random, transient or dynamic loading. In applications where there is a large displacement a novel software feature is available to provide accurate motion compensation.

When used to measure heat dissipation on a structure under dynamic loading (D-MODE) the ALTAIR Li system can also be used to rapidly determine the materials fatigue limit and provide information on the damage mechanism involved.