Kistler introduces Type 8640A IEPE PiezoBeam® accelerometer with TEDS for multi-channel modal analysis of small structures

Kistler Instrument Corporation (www.kistler.com), a worldwide supplier of precision sensors, systems and instrumentation for the dynamic measurement of pressure, force, torque and acceleration, has announced the North American launch of Type 8640A, a lightweight, miniature single axis IEPE accelerometer family with optional TEDS, designed for the multi-channel modal and structural analysis of small or thin-walled structures and components, as well as other general purpose vibration measurements.

Offered in ranges of ±5 g, ±10 g and ±50 g, with sensitivities from 100 to 1000 mV/g, the low-noise Type 8640A is Kistler's dimensionally smallest PiezoBeam® single axis accelerometer model with lowest mass, weighing just 3.5 grams. Its internal ceramic cantilever beam sensing element is thermally compensated using patented methods, and is supported by a center post that emits an electrical charge when bended during exposure to vibration. (World patent number W0/2007/062532; European Patent: 2006790940; US patent number 12,088,325). This Kistler proprietary accelerometer design provides outstanding amplitude and phase response over a wide frequency range with low base strain sensitivity and exceptional measurement stability. Sensing elements are housed in a highly durable and hermetically sealed welded titanium housing.

Kistler Type 8640A accelerometers feature an integral 10-32 connector that is expressly designed for easy installation into space constrained environments. Units are ground isolated when mounted with the optional mounting twist-clip or adhesive mounting adapter. This accelerometer family operates directly from the internal power source found in most FFT analyzers, as well as from several Kistler Piezotron® power supply couplers or any industry standard IEPE-compatible power source. With its low impedance output, high sensitivity and high dynamic range, the Type 8640A accelerometer is ideally suited for multi-channel modal and structural analysis of small components or subsystems, as well as full vehicle testing within aerospace, commercial aviation, automotive and general laboratory testing environments.