Aehr Test Systems (NASDAQ:AEHR) , a leading supplier of semiconductor test and burn-in equipment, today announced it has received an order for its new Advanced Burn-in and Test System (ABTS) from a leading US aerospace company. The system is configured for burning-in and testing high pin count logic devices.

"This will be our first shipment of a high pin count system. It will be used for reliability testing of complex logic for aerospace and military applications," said Greg Perkins, vice president of worldwide sales and service at Aehr Test Systems. "The customer's primary need is the flexibility to provide 32M vectors on all 320 I/Os in the system plus the ability to capture per pin device failures while doing test during burn-in. We have sold the ABTS into a wide range of Test and Burn-in applications in both Asia and Europe."

The ABTS family of products is based on a new hardware and software architecture that is designed to address not only today's devices, but also future devices for many years to come. It can test and burn-in memory as well as both high-power logic and low-power logic in addition to high pin count logic. It can be configured to provide individual device temperature control for devices up to 50W or more and with up to 320 I/O channels. It uses N+1 redundancy technology for many key components in the system to provide the highest possible system uptime.