The new Vanta iX in-line X-ray fluorescence (XRF) analyser automates material analysis and alloy ID on the manufacturing line, delivering instant results for real-time process monitoring and 100% inspection. Designed to operate 24/7, the analyser streamlines quality inspections for metal fabrication and geo processing.
Metal fabrication requires 24/7 process control to verify that products are being manufactured using the correct alloy to avoid costly material mix-ups. The Vanta iX analyser provides clear material and grade ID in seconds, so metal fabricators can demonstrate that their products are 100% tested and verified. The instrument can deliver pass/fail results or full material chemistry.
For geological processing and mining, the analyser enables core scanning and on-belt analysis with real-time results to monitor process variability and ensure ore grade consistency.
With a silicon drift detector (SDD) and Olympus' proven Axon Technology, the analyser can test a wide range of alloy and metal grades—including light elements. It brings the same high-count rate and stability as the rest of the Vanta series.
The Vanta iX analyser is easy to install in manufacturing environments—use the mounting holes on each side to mount the analyser onto robotics and other systems.
Modern Data Transfer
Easily control the analyser with either the Vanta Connect API or a PLC and discrete wire. Connector options include Ethernet (RJ-45) for Power over Ethernet, USB, Discrete I/O (16 pins) and AUX DC power.
Rugged for the Manufacturing Line
Built to endure the high levels of vibration, electromagnetic and acoustical noise, dust and moisture of production facilities, the analyser is vibration tested (MIL-STD-810G), IP54 rated and designed to operate from –10 °C to 50 °C (14 °F to 122 °F) with continuous testing. A built-in heat sink lowers the internal temperature, while fan attachment points are available if extra cooling is needed. The analyser offers toolless window changes for fast maintenance.
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